Issued Patents All Time
Showing 25 most recent of 102 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12304749 | Turn-bolt device for a transporting star wheel | — | 2025-05-20 |
| 12148640 | Method and apparatus for use in wafer processing | Gerald Lackner, Walter Leitgeb, Michael Lecher | 2024-11-19 |
| 12112992 | Package having an electronic component and an encapsulant encapsulating a dielectric layer and a semiconductor die of the electronic component | Daniel Porwol, Uwe Seidel, Anton Steltenpohl | 2024-10-08 |
| 11976507 | Method for allocating operating parameters to local control units intended to control a door movement in a motor vehicle | Florian Pohl, Udo Geuther, Rene Bekendam | 2024-05-07 |
| 11947001 | Measurement setup, reference reflector as well as method for measuring attenuation | Sherif Ahmed, Frank Gumbmann, Tobias Koeppel, Michael Freissl, Christian Evers | 2024-04-02 |
| D1003291 | Device holder | — | 2023-10-31 |
| 11730572 | Apparatus for attaching a dental component to a dental implant | Adrian Haus, Lars Jorneus, Thomas Eriksson, Mikael Brunell | 2023-08-22 |
| 11720028 | Measurement illumination optical unit for guiding illumination light into an object field of a projection exposure system for EUV lithography | Lars Wischmeier, Michael Patra, Hubert Holderer | 2023-08-08 |
| 11637028 | Method and apparatus for use in wafer processing | Gerald Lackner, Walter Leitgeb, Michael Lecher | 2023-04-25 |
| 11605572 | Electronic component with semiconductor die having a low ohmic portion with an active area and a high ohmic portion on a dielectric layer | Daniel Porwol, Uwe Seidel, Anton Steltenpohl | 2023-03-14 |
| 11465179 | Processing of solid micron sized particles for rapid deposition on substrate surfaces with uniform particle distribution | Robert Furstenberg, Viet K. Nguyen, R. Andrew McGill, Chris Kendziora, Michael Papantonakis | 2022-10-11 |
| 11204654 | Organic haptic interface | Ferdinand Maier | 2021-12-21 |
| 11169445 | Pupil facet mirror, optical system and illumination optics for a projection lithography system | Stig Bieling, Martin Endres | 2021-11-09 |
| 11061112 | Method for monitoring the performance range of an automotive radar system | — | 2021-07-13 |
| 10985041 | Method and apparatus for use in wafer processing | Gerald Lackner, Walter Leitgeb, Michael Lecher | 2021-04-20 |
| 10962349 | Device for measuring points in space | Thomas W. Roller, Urs Reich | 2021-03-30 |
| 10955544 | Measurement setup, reference reflector as well as method for measuring attenuation | Sherif Ahmed, Frank Gumbmann, Tobias Koeppel, Michael Freissl, Christian Evers | 2021-03-23 |
| 10947944 | Method and device for determining the injection rate of an injection valve | Clemens Majer, Iris Hartung | 2021-03-16 |
| 10877139 | Radar system of a vehicle and method for detecting an object in standstill situation | — | 2020-12-29 |
| 10690100 | Device for measuring the injection rate, method for producing a device of said type, and measuring method | Clemens Majer, Iris Hartung, Wolfgang Sander | 2020-06-23 |
| 10600670 | Frame mounting after foil expansion | — | 2020-03-24 |
| 10488567 | Faceted mirror for EUV projection lithography and illumination optical unit with same | Sarina Wunderlich | 2019-11-26 |
| 10416049 | Processing of solid micron sized particles for rapid deposition on substrate surfaces with uniform particle distribution | Robert Furstenberg, Viet K. Nguyen, R Andrew McGill, Chris Kendziora, Michael Papantonakis | 2019-09-17 |
| 10403506 | Separation of workpiece with three material removal stages | Christoph Kamseder, Franco Mariani, Andreas Bauer | 2019-09-03 |
| 10388610 | Electronic chip inspection by backside illumination | — | 2019-08-20 |