| 7492648 |
Reducing leakage current in memory device using bitline isolation |
Andre Sturm, Christopher Miller, Wolfgang Hokenmaier, Jochen Hoffman |
2009-02-17 |
| 7443751 |
Programmable sense amplifier multiplexer circuit with dynamic latching mode |
Christopher Miller |
2008-10-28 |
| 7405957 |
Edge pad architecture for semiconductor memory |
Josef Schnell, Michael Richter |
2008-07-29 |
| 7257038 |
Test mode for IPP current measurement for wordline defect detection |
Martin Versen, Grant McNeil, Zach Johnson, Changduk Kim |
2007-08-14 |
| 6972613 |
Fuse latch circuit with non-disruptive re-interrogation |
Nicholas M. van Heel |
2005-12-06 |
| 6580655 |
Pre-charge circuit and method for memory devices with shared sense amplifiers |
Mark D. Jacunski |
2003-06-17 |
| 6399990 |
Isolated well ESD device |
Ciaran J. Brennan, Mark D. Jacunski, William R. Tonti |
2002-06-04 |
| 6160747 |
Configuration for crosstalk attenuation in word lines of DRAM circuits |
Martin Brox, Helmut Schneider, Thomas Vogelsang |
2000-12-12 |
| 6049492 |
Interleaved sense amplifier with a single-sided precharge device |
Thomas Vogelsang |
2000-04-11 |
| 5444398 |
Decoded-source sense amplifier with special column select driver voltage |
Oliver Kiehl, Fergal Bonner, Klaus J. Lau |
1995-08-22 |
| 5440258 |
Off-chip driver with voltage regulated predrive |
Duane E. Galbi, Russell J. Houghton, Adam Wilson |
1995-08-08 |
