Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7257038 | Test mode for IPP current measurement for wordline defect detection | Michael Killian, Martin Versen, Zach Johnson, Changduk Kim | 2007-08-14 |
| 6943396 | Electro-static discharge protection circuit and method for making the same | — | 2005-09-13 |