Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7729186 | Method and system for testing an integrated circuit | Joerg Kliewer, Klaus Nierle | 2010-06-01 |
| 7542362 | Sense-amplifier circuit for a memory device with an open bit line architecture | Helmut Schneider | 2009-06-02 |
| 7428673 | Test method for determining the wire configuration for circuit carriers with components arranged thereon | Jorg Kliewer | 2008-09-23 |
| 7405986 | Redundant wordline deactivation scheme | Peter Thwaite | 2008-07-29 |
| 7380182 | Method and apparatus for checking output signals of an integrated circuit | Peter Beer, Achim Schramm | 2008-05-27 |
| 7340313 | Monitoring device for monitoring internal signals during initialization of an electronic circuit | Manfred Moser, Erwin Thalmann | 2008-03-04 |
| 7339841 | Test mode method and apparatus for internal memory timing signals | Klaus Nierle, Oliver Kiehl, Ernst Stahl | 2008-03-04 |
| 7308624 | Voltage monitoring test mode and test adapter | Daewon Lee | 2007-12-11 |
| 7263019 | Serial presence detect functionality on memory component | Klaus Nierle | 2007-08-28 |
| 7257038 | Test mode for IPP current measurement for wordline defect detection | Michael Killian, Grant McNeil, Zach Johnson, Changduk Kim | 2007-08-14 |
| 7203106 | Integrated semiconductor memory with redundant memory cells | Martin Perner | 2007-04-10 |
| 7191085 | Method for testing an electric circuit | Thomas Neyer, Erwin Thalmann | 2007-03-13 |
| 7184337 | Method for testing an integrated semiconductor memory | — | 2007-02-27 |
| 7124336 | Method for the defect analysis of memory modules | Frank Adler | 2006-10-17 |
| 7120070 | Method for testing the serviceability of bit lines in a DRAM memory device | Klaus Nierle | 2006-10-10 |
| 6862234 | Method and test circuit for testing a dynamic memory circuit | Peter Beer, Lee Nino | 2005-03-01 |
| 6703844 | Method for determining the transit time of electrical signals on printed circuit boards using automatic standard test equipment | Frank Adler, Thomas Huber, Manfred Moser | 2004-03-09 |