Issued Patents All Time
Showing 25 most recent of 40 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8051048 | System and method for automated transfer and evaluation of the quality of mass data of a technical process or a technical project | Andreas Liefeldt | 2011-11-01 |
| 7929362 | Integrated semiconductor memory with distributor line for redundant data lines | — | 2011-04-19 |
| 7821856 | Memory device having an evaluation circuit | — | 2010-10-26 |
| 7573761 | Integrated electrical module with regular and redundant elements | — | 2009-08-11 |
| 7490274 | Method and apparatus for masking known fails during memory tests readouts | Jochen Hoffmann, Carsten Ohlhoff | 2009-02-10 |
| 7468910 | Method for accessing a memory | — | 2008-12-23 |
| 7380182 | Method and apparatus for checking output signals of an integrated circuit | Achim Schramm, Martin Versen | 2008-05-27 |
| 7302622 | Integrated memory having a test circuit for functional testing of the memory | — | 2007-11-27 |
| 7231562 | Memory module, test system and method for testing one or a plurality of memory modules | Carsten Ohlhoff | 2007-06-12 |
| 7205596 | Adiabatic rotational switching memory element including a ferromagnetic decoupling layer | Ulrich Klostermann, Manfred Ruehrig | 2007-04-17 |
| 7197678 | Test circuit and method for testing an integrated memory circuit | Carsten Ohlhoff | 2007-03-27 |
| 7162663 | Test system and method for testing memory circuits | Alan Morgan | 2007-01-09 |
| 7159156 | Memory chip with test logic taking into consideration the address of a redundant word line and method for testing a memory chip | — | 2007-01-02 |
| 7137049 | Method and apparatus for masking known fails during memory tests readouts | Jochen Hoffmann, Carsten Ohlhoff | 2006-11-14 |
| 7107501 | Test device, test system and method for testing a memory circuit | Carsten Ohlhoff | 2006-09-12 |
| 7088612 | MRAM with vertical storage element in two layer-arrangement and field sensor | Daniel Braun, Rainer Leuschner, Ulrich Klostermann | 2006-08-08 |
| 7080297 | Memory circuit and method for reading out data | — | 2006-07-18 |
| 7038956 | Apparatus and method for reading out defect information items from an integrated chip | — | 2006-05-02 |
| 7009869 | Dynamic memory cell | — | 2006-03-07 |
| 6985390 | Integrated memory circuit having a redundancy circuit and a method for replacing a memory area | — | 2006-01-10 |
| 6922365 | Read-out circuit for a dynamic memory circuit, memory cell array, and method for amplifying and reading data stored in a memory cell array | — | 2005-07-26 |
| 6891431 | Integrated semiconductor circuit configuration | Carsten Ohlhoff | 2005-05-10 |
| 6862234 | Method and test circuit for testing a dynamic memory circuit | Martin Versen, Lee Nino | 2005-03-01 |
| 6858447 | Method for testing semiconductor chips | Udo Hartmann, Jochen Kallscheuer | 2005-02-22 |
| 6831320 | Memory cell configuration for a DRAM memory with a contact bit terminal for two trench capacitors of different rows | — | 2004-12-14 |