| 7574643 |
Test apparatus and method for testing a circuit unit |
Stefan Gollmer, Hans-Christoph Ostendorf |
2009-08-11 |
| 7490274 |
Method and apparatus for masking known fails during memory tests readouts |
Jochen Hoffmann, Peter Beer |
2009-02-10 |
| 7231562 |
Memory module, test system and method for testing one or a plurality of memory modules |
Peter Beer |
2007-06-12 |
| 7197678 |
Test circuit and method for testing an integrated memory circuit |
Peter Beer |
2007-03-27 |
| 7137049 |
Method and apparatus for masking known fails during memory tests readouts |
Jochen Hoffmann, Peter Beer |
2006-11-14 |
| 7120841 |
Data generator for generating test data for word-oriented semiconductor memories |
— |
2006-10-10 |
| 7107501 |
Test device, test system and method for testing a memory circuit |
Peter Beer |
2006-09-12 |
| 7092303 |
Dynamic memory and method for testing a dynamic memory |
— |
2006-08-15 |
| 6891431 |
Integrated semiconductor circuit configuration |
Peter Beer |
2005-05-10 |
| 6756787 |
Integrated circuit having a current measuring unit |
Peter Beer |
2004-06-29 |
| 6671221 |
Semiconductor chip with trimmable oscillator |
Peter Beer |
2003-12-30 |
| 6670665 |
Memory module with improved electrical properties |
Peter Beer, Helmut Schneider |
2003-12-30 |
| 6661718 |
Testing device for testing a memory |
Peter Pöchmüller |
2003-12-09 |
| 6657452 |
Configuration for measurement of internal voltages of an integrated semiconductor apparatus |
Peter Beer |
2003-12-02 |
| 6639856 |
Memory chip having a test mode and method for checking memory cells of a repaired memory chip |
Peter Beer |
2003-10-28 |
| 6549028 |
Configuration and process for testing a multiplicity of semiconductor chips on a wafer plane |
— |
2003-04-15 |
| 6504394 |
Configuration for trimming reference voltages in semiconductor chips, in particular semiconductor memories |
— |
2003-01-07 |
