Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7574643 | Test apparatus and method for testing a circuit unit | Stefan Gollmer, Carsten Ohlhoff | 2009-08-11 |
| 7206985 | Method and apparatus for calibrating a test system for an integrated semiconductor circuit | — | 2007-04-17 |
| 6897646 | Method for testing wafers to be tested and calibration apparatus | Thomas Grebner, Michael Schittenhelm, Erwin Thalmann | 2005-05-24 |