Issued Patents All Time
Showing 25 most recent of 32 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7466761 | Configuration for the transmission of signals between a data processing device and a functional unit | — | 2008-12-16 |
| 7203123 | Integrated DRAM memory device | — | 2007-04-10 |
| 7193426 | Test system and test structure for testing an integrated circuit and an integrated circuit having a test structure | — | 2007-03-20 |
| 7117403 | Method and device for generating digital signal patterns | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jens Lüpke, Jochen Müller +1 more | 2006-10-03 |
| 7113417 | Integrated memory circuit | — | 2006-09-26 |
| 7062690 | System for testing fast synchronous digital circuits, particularly semiconductor memory chips | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jens Lüpke, Jochen Müller +1 more | 2006-06-13 |
| 6871306 | Method and device for reading and for checking the time position of data response signals read out from a memory module to be tested | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jens Lüpke, Jochen Müller +1 more | 2005-03-22 |
| 6862702 | Address counter for addressing synchronous high-frequency digital circuits, in particular memory devices | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jens Lüpke, Jochen Müller +1 more | 2005-03-01 |
| 6839397 | Circuit configuration for generating control signals for testing high-frequency synchronous digital circuits | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jens Lüpke, Jochen Müller +1 more | 2005-01-04 |
| 6822913 | Integrated memory and method for operating an integrated memory | — | 2004-11-23 |
| 6762611 | Test configuration and test method for testing a plurality of integrated circuits in parallel | Michael Hübner, Gunnar Krause, Justus Kuhn, Jochen Müller, Jürgen Weidenhöfer | 2004-07-13 |
| 6741491 | Integrated dynamic memory, and method for operating the integrated dynamic memory | — | 2004-05-25 |
| 6721904 | System for testing fast integrated digital circuits, in particular semiconductor memory modules | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jens Lüpke, Jochen Müller +1 more | 2004-04-13 |
| 6661718 | Testing device for testing a memory | Carsten Ohlhoff | 2003-12-09 |
| 6646937 | Integrated clock generator, particularly for driving a semiconductor memory with a test signal | — | 2003-11-11 |
| 6618836 | Configuration and method for producing test signals for testing a multiplicity of semiconductor chips | — | 2003-09-09 |
| 6601194 | Circuit configuration for repairing a semiconductor memory | Wilfried Dähn | 2003-07-29 |
| 6556492 | System for testing fast synchronous semiconductor circuits | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jens Lüpke, Jochen Müller +1 more | 2003-04-29 |
| 6542430 | Integrated memory and memory configuration with a plurality of memories and method of operating such a memory configuration | — | 2003-04-01 |
| 6535009 | Configuration for carrying out burn-in processing operations of semiconductor devices at wafer level | — | 2003-03-18 |
| 6515319 | Field-effect-controlled transistor and method for fabricating the transistor | Dietrich Widmann, Armin Wieder, Justus Kuhn, Jens Lüpke, Jochen Müller +1 more | 2003-02-04 |
| 6490191 | Method and configuration for compensating for parasitic current losses | — | 2002-12-03 |
| 6487108 | MRAM configuration | — | 2002-11-26 |
| 6472892 | Configuration for testing chips using a printed circuit board | — | 2002-10-29 |
| 6456098 | Method of testing memory cells with a hysteresis curve | — | 2002-09-24 |