Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7117403 | Method and device for generating digital signal patterns | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jochen Müller, Peter Pöchmüller +1 more | 2006-10-03 |
| 7117404 | Test circuit for testing a synchronous memory circuit | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Peter Poechmüller, Jochen Mueller +1 more | 2006-10-03 |
| 7062690 | System for testing fast synchronous digital circuits, particularly semiconductor memory chips | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jochen Müller, Peter Pöchmüller +1 more | 2006-06-13 |
| 6871306 | Method and device for reading and for checking the time position of data response signals read out from a memory module to be tested | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jochen Müller, Peter Pöchmüller +1 more | 2005-03-22 |
| 6862702 | Address counter for addressing synchronous high-frequency digital circuits, in particular memory devices | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jochen Müller, Peter Pöchmüller +1 more | 2005-03-01 |
| 6839397 | Circuit configuration for generating control signals for testing high-frequency synchronous digital circuits | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jochen Müller, Peter Pöchmüller +1 more | 2005-01-04 |
| 6721904 | System for testing fast integrated digital circuits, in particular semiconductor memory modules | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jochen Müller, Peter Pöchmüller +1 more | 2004-04-13 |
| 6556492 | System for testing fast synchronous semiconductor circuits | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jochen Müller, Peter Pöchmüller +1 more | 2003-04-29 |
| 6535007 | Component holder for testing devices and component holder system microlithography | Hermann Haas | 2003-03-18 |
| 6515319 | Field-effect-controlled transistor and method for fabricating the transistor | Dietrich Widmann, Armin Wieder, Justus Kuhn, Jochen Müller, Peter Pöchmüller +1 more | 2003-02-04 |
| 6396752 | Method of testing a memory cell having a floating gate | Peter Pöchmüller | 2002-05-28 |
| 6268718 | Burn-in test device | Frank Weber, Joseph Sillup | 2001-07-31 |