WE

Wolfgang Ernst

Infineon Technologies Ag: 11 patents #789 of 7,486Top 15%
Overall (All Time): #426,257 of 4,157,543Top 15%
12
Patents All Time

Issued Patents All Time

Showing 1–12 of 12 patents

Patent #TitleCo-InventorsDate
7117403 Method and device for generating digital signal patterns Gunnar Krause, Justus Kuhn, Jens Lüpke, Jochen Müller, Peter Pöchmüller +1 more 2006-10-03
7117404 Test circuit for testing a synchronous memory circuit Gunnar Krause, Justus Kuhn, Jens Lüpke, Peter Poechmüller, Jochen Mueller +1 more 2006-10-03
7062690 System for testing fast synchronous digital circuits, particularly semiconductor memory chips Gunnar Krause, Justus Kuhn, Jens Lüpke, Jochen Müller, Peter Pöchmüller +1 more 2006-06-13
6957373 Address generator for generating addresses for testing a circuit Justus Kuhn, Jens Luepke, Peter Poechmüller, Gunnar Krause, Jochen Mueller +1 more 2005-10-18
6871306 Method and device for reading and for checking the time position of data response signals read out from a memory module to be tested Gunnar Krause, Justus Kuhn, Jens Lüpke, Jochen Müller, Peter Pöchmüller +1 more 2005-03-22
6865707 Test data generator Gunnar Krause, Justus Kuhn, Jens Luepke, Jochen Mueller, Peter Poechmueller +1 more 2005-03-08
6862702 Address counter for addressing synchronous high-frequency digital circuits, in particular memory devices Gunnar Krause, Justus Kuhn, Jens Lüpke, Jochen Müller, Peter Pöchmüller +1 more 2005-03-01
6839397 Circuit configuration for generating control signals for testing high-frequency synchronous digital circuits Gunnar Krause, Justus Kuhn, Jens Lüpke, Jochen Müller, Peter Pöchmüller +1 more 2005-01-04
6744272 Test circuit Gunnar Krause, Justus Kuhn, Jens Luepke, Jochen Mueller, Peter Poechmueller +1 more 2004-06-01
6721904 System for testing fast integrated digital circuits, in particular semiconductor memory modules Gunnar Krause, Justus Kuhn, Jens Lüpke, Jochen Müller, Peter Pöchmüller +1 more 2004-04-13
6618305 Test circuit for testing a circuit Gunnar Krause, Peter Poechmueller, Justus Kuhn, Jens Luepke, Jochen Mueller +1 more 2003-09-09
6556492 System for testing fast synchronous semiconductor circuits Gunnar Krause, Justus Kuhn, Jens Lüpke, Jochen Müller, Peter Pöchmüller +1 more 2003-04-29