Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6853206 | Method and probe card configuration for testing a plurality of integrated circuits in parallel | Michael Hübner, Gunnar Krause, Justus Kuhn, Jochen Müller, Peter P{hacek over (o)}chmüller | 2005-02-08 |
| 6762611 | Test configuration and test method for testing a plurality of integrated circuits in parallel | Michael Hübner, Gunnar Krause, Justus Kuhn, Jochen Müller, Peter Pöchmüller | 2004-07-13 |