Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8468401 | Apparatus and method for manufacturing a multiple-chip memory device with multi-stage testing | KoonHee Lee, Ryan C. Patterson, Hoon Ryu | 2013-06-18 |
| 7802133 | System and method for addressing errors in a multiple-chip memory device | KoonHee Lee, Ryan C. Patterson, Hoon Ryu | 2010-09-21 |
| 7729186 | Method and system for testing an integrated circuit | Joerg Kliewer, Martin Versen | 2010-06-01 |
| 7385872 | Method and apparatus for increasing clock frequency and data rate for semiconductor devices | KoonHee Lee | 2008-06-10 |
| 7339841 | Test mode method and apparatus for internal memory timing signals | Martin Versen, Oliver Kiehl, Ernst Stahl | 2008-03-04 |
| 7263019 | Serial presence detect functionality on memory component | Martin Versen | 2007-08-28 |
| 7157923 | Method for full wafer contact probing, wafer design and probe card device with reduced probe contacts | Peter Schneider | 2007-01-02 |
| 7120070 | Method for testing the serviceability of bit lines in a DRAM memory device | Martin Versen | 2006-10-10 |
| 7072234 | Method and device for varying an active duty cycle of a wordline | — | 2006-07-04 |