| 7276775 |
Intrinsic dual gate oxide MOSFET using a damascene gate process |
Claude L. Bertin, Anthony J. Dally, John A. Fifield, John Jesse Higgins, Jack A. Mandelman +1 more |
2007-10-02 |
| 6972613 |
Fuse latch circuit with non-disruptive re-interrogation |
Michael Killian |
2005-12-06 |
| 6930503 |
System for testing integrated circuit devices |
Joseph C. Sher, David D. Siek, Huy T. Vo, Victor Wong, Hua Zheng |
2005-08-16 |
| 6756805 |
System for testing integrated circuit devices |
Joseph C. Sher, David D. Siek, Huy T. Vo, Victor Wong, Hua Zheng |
2004-06-29 |
| 6570806 |
System and method for improving DRAM single cell fail fixability and flexibility repair at module level and universal laser fuse/anti-fuse latch therefor |
Claude L. Bertin, John A. Fifield, Jason Varricchione |
2003-05-27 |
| 6531410 |
Intrinsic dual gate oxide MOSFET using a damascene gate process |
Claude L. Bertin, Anthony J. Dally, John A. Fifield, John Jesse Higgins, Jack A. Mandelman +1 more |
2003-03-11 |
| 6452439 |
Inductive voltage spike generator with diode shunt |
John A. Fifield |
2002-09-17 |
| 6420925 |
Programmable latch device with integrated programmable element |
John A. Fifield, Erik L. Hedberg, Claude L. Bertin |
2002-07-16 |
| 6400202 |
Programmable delay element and synchronous DRAM using the same |
John A. Fifield, Mark D. Jacunski, David Chapman, David E. Douse |
2002-06-04 |
| 6384666 |
Antifuse latch device with controlled current programming and variable trip point |
Claude L. Bertin, John A. Fifield, Russell J. Houghton |
2002-05-07 |
| 6373771 |
Integrated fuse latch and shift register for efficient programming and fuse readout |
John A. Fifield, Wayne F. Ellis |
2002-04-16 |
| 6348827 |
Programmable delay element and synchronous DRAM using the same |
John A. Fifield, Mark D. Jacunski, David Chapman, David E. Douse |
2002-02-19 |
| 6346846 |
Methods and apparatus for blowing and sensing antifuses |
Claude L. Bertin, John A. Fifield, Russell J. Houghton, William R. Tonti |
2002-02-12 |
| 6339559 |
Decode scheme for programming antifuses arranged in banks |
Claude L. Bertin, John A. Fifield |
2002-01-15 |
