Issued Patents All Time
Showing 1–21 of 21 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7102908 | Reliable ferro fuse cell | Roehr Thomas, Nobert Rehm | 2006-09-05 |
| 6999887 | Memory cell signal window testing apparatus | Norbert Rehm, Michael Jacob, Joerg Wohlfahrt | 2006-02-14 |
| 6972983 | Increasing the read signal in ferroelectric memories | Thomas Roehr | 2005-12-06 |
| 6906969 | Hybrid fuses for redundancy | Thomas Roehr, Norbert Rehm, Tadashi Miyakawa | 2005-06-14 |
| 6903959 | Sensing of memory integrated circuits | Thomas Roehr, Joerg Wohlfahrt, Norbert Rehm | 2005-06-07 |
| 6885597 | Sensing test circuit | Thomas Roehr, Michael Jacob, Joerg Wohlfahrt, Takashima Daisaburo | 2005-04-26 |
| 6876590 | 2T2C signal margin test mode using a defined charge exchange between BL and/BL | Michael Jacob, Nobert Rehm | 2005-04-05 |
| 6856560 | Redundancy in series grouped memory architecture | Norbert Rehm, Thomas Roehr, Joerg Wohlfahrt | 2005-02-15 |
| 6826099 | 2T2C signal margin test mode using a defined charge and discharge of BL and /BL | Thomas Roehr, Joerg Wohlfahrt | 2004-11-30 |
| 6807084 | FeRAM memory device | Joerg Wohlfahrt | 2004-10-19 |
| 6707699 | Historical information storage for integrated circuits | Michael Jacob, Joerg Wohlfahrt, Norbert Rehm | 2004-03-16 |
| 6687150 | Reference voltage generation for memory circuits | Takashima Daisaburo | 2004-02-03 |
| 6584009 | Memory integrated circuit with improved reliability | Thomas Roehr | 2003-06-24 |
| 6323103 | Method for fabricating transistors | Rajesh Rengarajan, Jochen Beintner, Ulrike Gruening | 2001-11-27 |
| 6323532 | Deep divot mask for enhanced buried-channel PFET performance and reliability | Jack A. Mandelman, Rajesh Rengarajah | 2001-11-27 |
| 6265742 | Memory cell structure and fabrication | Ulrike Gruening, Jochen Beintner | 2001-07-24 |
| 6236617 | High performance CMOS word-line driver | Louis L. Hsu, Matthew R. Wordeman, Hing Wong | 2001-05-22 |
| 6127215 | Deep pivot mask for enhanced buried-channel PFET performance and reliability | Jack A. Mandelman, Rajesh Rengarajan | 2000-10-03 |
| 6093614 | Memory cell structure and fabrication | Ulrike Gruening, Jochen Beintner | 2000-07-25 |
| 5926703 | LDD device having a high concentration region under the channel | Yasuo Yamaguchi, Yasuo Inoue | 1999-07-20 |
| 5641980 | Device having a high concentration region under the channel | Yasuo Yamaguchi, Yasuo Inoue | 1997-06-24 |