Issued Patents All Time
Showing 25 most recent of 27 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9891256 | Determining the current return path integrity in an electric device connected or connectable to a further device | Erich Klink, Jurgen Saalmuller | 2018-02-13 |
| 9709625 | Measuring power consumption in an integrated circuit | Martin Eckert, Claudio Siviero, Jochen Supper, Otto A. Torreiter, Thomas-Michael Winkel | 2017-07-18 |
| 9581631 | Determining the current return path integrity in an electric device connected or connectable to a further device | Erich Klink, Jurgen Saalmuller | 2017-02-28 |
| 9304158 | Determining the current return path integrity in an electric device connected or connectable to a further device | Erich Klink, Jurgen Saalmuller | 2016-04-05 |
| 9134364 | Determining the current return path integrity in an electric device connected or connectable to a further device | Erich Klink, Jurgen Saalmuller | 2015-09-15 |
| 9094306 | Network power fault detection | Martin Eckert, Claudio Siviero, Jochen Supper, Otto A. Torreiter, Thomas-Michael Winkel | 2015-07-28 |
| 8866504 | Determining local voltage in an electronic system | Martin Eckert, Otto A. Torreiter, Dieter Wendel | 2014-10-21 |
| 8659310 | Method and system for performing self-tests in an electronic system | Martin Eckert, Jochen Supper, Otto A. Torreiter | 2014-02-25 |
| 8645091 | Evaluating high frequency time domain in embedded device probing | Joseph Curtis Diepenbrock | 2014-02-04 |
| 8519720 | Method and system for impedance measurement in an integrated Circuit | Jochen Supper, Thomas-Michael Winkel | 2013-08-27 |
| 8271220 | Evaluating high frequency time domain in embedded device probing | Joseph Curtis Diepenbrock | 2012-09-18 |
| 8248082 | Method for determining the current return path integrity in an electric device connected or connectable to a further device | Erich Klink, Jurgen Saalmuller | 2012-08-21 |
| 8222535 | Noise reducing circuit arrangement | Thomas-Michael Winkel, Erich Klink | 2012-07-17 |
| 8000916 | System and method for evaluating high frequency time domain in embedded device probing | Joseph Curtis Diepenbrock | 2011-08-16 |
| 7742315 | Circuit on a printed circuit board | Wiren D. Becker, Bruce J. Chamberlin, Gerald J. Fahr, Dierk Kaller, George A. Katopis +2 more | 2010-06-22 |
| 7355125 | Printed circuit board and chip module | Wiren D. Becker, Bruce J. Chamberlin, Andreas Huber, George A. Katopis, Erich Klink +2 more | 2008-04-08 |
| 7250812 | Integrated circuit current regulator | Bernd Garben | 2007-07-31 |
| 6967398 | Module power distribution network | Bernd Garben, Erich Klink, Stefano Oggioni | 2005-11-22 |
| 6774836 | Method for delta-noise reduction | Bernd Garben, Hubert Harrer, Andreas Huber, Dierk Kaller, Erich Klink +2 more | 2004-08-10 |
| 6665843 | Method and system for quantifying the integrity of an on-chip power supply network | Andreas Huber, Erich Klink, Jochen Supper | 2003-12-16 |
| 6535075 | Tunable on-chip capacity | Erich Klink, Jochen Supper | 2003-03-18 |
| 6437252 | Method and structure for reducing power noise | Simone Rehm, Erich Klink, Helmut Virag, Thomas-Michael Winkel, Wiren D. Becker +2 more | 2002-08-20 |
| 6424058 | Testable on-chip capacity | Erich Klink, Jochen Supper | 2002-07-23 |
| 6043724 | Two-stage power noise filter with on and off chip capacitors | Erich Klink, William F. Shutler, Ulrich Weiss, Thomas-Michael Winkel | 2000-03-28 |
| 5956563 | Method for reducing a transient thermal mismatch | Erich Klink, Dietmar Schmunkamp, Helmut H. Weber, Bernd Garben, Hubert Harrer | 1999-09-21 |