MG

Michael S. Gordon

IBM: 205 patents #153 of 70,183Top 1%
Google: 14 patents #1,679 of 22,993Top 8%
NI Nikon: 11 patents #395 of 2,493Top 20%
Globalfoundries: 4 patents #817 of 4,424Top 20%
UA University Of Arizona: 2 patents #250 of 1,318Top 20%
NE Nec: 1 patents #7,889 of 14,502Top 55%
GU Globalfoundries U.S.: 1 patents #22 of 211Top 15%
MA Manugistics: 1 patents #9 of 46Top 20%
DO Doordash: 1 patents #73 of 135Top 55%
📍 Chappaqua, NY: #3 of 336 inventorsTop 1%
🗺 New York: #94 of 115,490 inventorsTop 1%
Overall (All Time): #2,068 of 4,157,543Top 1%
246
Patents All Time

Issued Patents All Time

Showing 201–225 of 246 patents

Patent #TitleCo-InventorsDate
8589391 Method and system for generating web site ratings for a user Jeff Reynar, Kushal Dave, Eric S. Flatt, Jeremy Hylton, James K. Scott +2 more 2013-11-19
8476683 On-chip radiation dosimeter Kenneth P. Rodbell, Jeng-Bang Yau 2013-07-02
8362600 Method and structure to reduce soft error rate susceptibility in semiconductor structures Cyril Cabral, Jr., David F. Heidel, Conal E. Murray, Kenneth P. Rodbell, Henry Tang 2013-01-29
8361829 On-chip radiation dosimeter Kenneth P. Rodbell, Jeng-Bang Yau 2013-01-29
8288177 SER testing for an IC chip using hot underfill Michael A. Gaynes, Nancy C. LaBianca, Kenneth F. Latzko, Aparna Prabhakar 2012-10-16
8212218 Dosimeter powered by passive RF absorption Cyril Cabral, Jr., Steven J. Koester, Conal E. Murray, Kenneth P. Rodbell, Stephen M. Rossnagel +2 more 2012-07-03
8166028 Method, system, and graphical user interface for improved searching via user-specified annotations Jeff Reynar, Kushal Dave, Eric S. Flatt, Jeremy Hylton, James K. Scott +2 more 2012-04-24
8166055 Event searching Nikhil Chandhok, Peter Solderitsch, Philo Juang 2012-04-24
8158449 Particle emission analysis for semiconductor fabrication steps Cyril Cabral, Jr., Jeff McMurray, Cristina Plettner, Paul A. Ronsheim 2012-04-17
8080805 FET radiation monitor Steven J. Koester, Kenneth P. Rodbell, Jeng-Bang Yau 2011-12-20
7939823 Method and structures for accelerated soft-error testing Kenneth P. Rodbell, Henry Tang 2011-05-10
7925676 Data object visualization using maps Andrew W. Hogue, David J. Vespe, Alexander Kehlenbeck, Jeffrey C. Reynar, David B. Alpert 2011-04-12
7781871 Structure for reduction of soft error rates in integrated circuits Cyril Cabral, Jr., Kenneth P. Rodbell 2010-08-24
7778952 Displaying facts on a linear graph David J. Vespe, Andrew W. Hogue, Alexander Kehlenbeck, Jeffrey C. Reynar, David B. Alpert 2010-08-17
7719887 CMOS storage devices configurable in high performance mode or radiation tolerant mode Ethan H. Cannon, Christopher LeBlanc, Kenneth P. Rodbell 2010-05-18
7649257 Discrete placement of radiation sources on integrated circuit devices Nancy C. LaBianca, Kenneth P. Rodbell 2010-01-19
7647353 Event searching Nikhil Chandhok, Peter Solderitsch, Philo Juang 2010-01-12
7601627 Method for reduction of soft error rates in integrated circuits Cyril Cabral, Jr., Kenneth P. Rodbell 2009-10-13
7555471 Data object visualization Andrew W. Hogue, David J. Vespe, Alexander Kehlenbeck, Jeffrey C. Reynar, David B. Alpert 2009-06-30
7498588 Tandem accelerator having low-energy static voltage injection and method of operation thereof Carl E. Bohnenkamp 2009-03-03
7491948 Method of detecting and transmitting radiation detection information to a network Kenneth P. Rodbell, Robert L. Wisnieff 2009-02-17
7381635 Method and structure for reduction of soft error rates in integrated circuits Cyril Cabral, Jr., Kenneth P. Rodbell 2008-06-03
7238547 Packaging integrated circuits for accelerated detection of transient particle induced soft error rates Theodore H. Zabel, Michael A. Gaynes, Nancy C. LaBianca, Jerry D. Ackaret 2007-07-03
7183758 Automatic exchange of degraders in accelerated testing of computer chips Carl E. Bohnenkamp, Ethan H. Cannon, Ethan W. Cascio, Kenneth P. Rodbell, Theodore H. Zabel 2007-02-27
7133848 Dynamic pricing system Robert Phillips, Ozgur Ozluk, Stefano Alberti, Robert Flint, Jorgen Andersson +4 more 2006-11-07