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Fin-type PIN diode array |
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ZRAM heterochannel memory |
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Measuring current and resistance using combined diodes/resistor structure to monitor integrated circuit manufacturing process variations |
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Measuring current and resistance using combined diodes/resistor structure to monitor integrated circuit manufacturing process variations |
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Diagnostic method for root-cause analysis of FET performance variation |
— |
2011-08-16 |
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Diagnostic method for root-cause analysis of FET performance variation |
— |
2009-09-08 |
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Method and structure to reduce CMOS inter-well leakage |
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Method and structure to reduce CMOS inter-well leakage |
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2004-02-03 |
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Method to suppress subthreshold leakage due to sharp isolation corners in submicron FET structures |
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Method to suppress subthreshold leakage due to sharp isolation corners in submicron FET structures |
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1996-10-22 |
