LI

Lewis W. Dewey, III

IBM: 17 patents #6,502 of 70,183Top 10%
📍 Wappingers Falls, NY: #116 of 884 inventorsTop 15%
🗺 New York: #8,460 of 115,490 inventorsTop 8%
Overall (All Time): #271,543 of 4,157,543Top 7%
17
Patents All Time

Issued Patents All Time

Showing 1–17 of 17 patents

Patent #TitleCo-InventorsDate
11314916 Capacitance extraction David J. Widiger, Steven Joseph Kurtz, Susan E. Cellier, Ronald D. Rose 2022-04-26
11176308 Extracting parasitic capacitance from circuit designs David J. Widiger, Steven Joseph Kurtz, Susan E. Cellier, Ronald D. Rose 2021-11-16
10685168 Capacitance extraction for floating metal in integrated circuit David J. Widiger, Ronald D. Rose, Harold E. Reindel 2020-06-16
10360338 Method for improving capacitance extraction performance by approximating the effect of distant shapes Susan E. Cellier, Anthony D. Hagin, Adam P. Matheny, Ron D. Rose, David J. Widiger +1 more 2019-07-23
10354041 Process for improving capacitance extraction performance Robert J. Allen, Susan E. Cellier, Anthony D. Hagin, Adam P. Matheny, Ronald D. Rose +1 more 2019-07-16
10169516 Methods and computer program products for via capacitance extraction Susan E. Cellier, Anthony D. Hagin, Adam P. Matheny, Ronald D. Rose, David J. Widiger 2019-01-01
9886541 Process for improving capacitance extraction performance Robert J. Allen, Susan E. Cellier, Anthony D. Hagin, Adam P. Matheny, Ronald D. Rose +1 more 2018-02-06
8645899 Method for extracting information for a circuit design David J. Widiger, Ronald D. Rose, Sandy K. Kao, Gerald F. Plumb 2014-02-04
8612918 Method for extracting information for a circuit design David J. Widiger, Ronald D. Rose, Sandy K. Kao, Gerald F. Plumb 2013-12-17
8539428 Method for extracting information for a circuit design David J. Widiger, Ronald D. Rose, Sandy K. Kao, Gerald F. Plumb 2013-09-17
8479131 Method of determining FET source/drain wire, contact, and diffusion resistances in the presence of multiple contacts Ning Lu, Judith H. McCullen, Cole E. Zemke 2013-07-02
8239804 Method for calculating capacitance gradients in VLSI layouts using a shape processing engine Ibrahim M. Elfadel, Tarek A. El-Moselhy, David J. Widiger, Patrick M. Williams 2012-08-07
8201122 Computing resistance sensitivities with respect to geometric parameters of conductors with arbitrary shapes Tarek Ali El Moselhy, Ibrahim M. Elfadel 2012-06-12
8136069 Accurate approximation of resistance in a wire with irregular biasing and determination of interconnect capacitances in VLSI layouts in the presence of Catastrophic Optical Proximity Correction Ibrahim M. Elfadel, David J. Widiger 2012-03-13
7290226 Via redundancy based on subnet timing information, target via distant along path from source and/or target via net/subnet characteristic Anthony Correale, Jr., Jason D. Hibbeler 2007-10-30
7075532 Robust tetrahedralization and triangulation method with applications in VLSI layout design and manufacturability Maharaj Mukherjee 2006-07-11
6854099 Balanced accuracy for extraction Peter A. Habitz, Thomas G. Mitchell 2005-02-08