Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8619236 | Determining lithographic set point using optical proximity correction verification simulation | James A. Bruce, Edward W. Conrad | 2013-12-31 |
| 8219964 | Method for creating electrically testable patterns | James A. Bruce, Edward W. Conrad | 2012-07-10 |
| 7562337 | OPC verification using auto-windowed regions | James A. Bruce, Gregory J. Dick, Donald P. Perley | 2009-07-14 |
| 7434185 | Method and apparatus for parallel data preparation and processing of integrated circuit graphical design data | Daria R. Dooling, Kenneth T. Settlemyer, Jr., Stephen D. Thomas, Ralph J. Williams | 2008-10-07 |
| 7269808 | Design verification | James A. Bruce, James A. Culp, John D. Nickel | 2007-09-11 |
| 6654488 | Fill pattern inspection | J. Richard Behun | 2003-11-25 |
| 6190836 | Methods for repair of photomasks | Brian J. Grenon, Richard A. Haight, Dennis M. Hayden, Michael S. Hibbs, J. Peter Levin +4 more | 2001-02-20 |
| 6180953 | Cut and blast defect to avoid chrome roll over annealing | — | 2001-01-30 |
| 6165649 | Methods for repair of photomasks | Brian J. Grenon, Richard A. Haight, Dennis M. Hayden, Michael S. Hibbs, J. Peter Levin +4 more | 2000-12-26 |
| 6156461 | Method for repair of photomasks | Brian J. Grenon, Richard A. Haight, Dennis M. Hayden, Michael S. Hibbs, J. Peter Levin +4 more | 2000-12-05 |
| 6090507 | Methods for repair of photomasks | Brian J. Grenon, Richard A. Haight, Dennis M. Hayden, Michael S. Hibbs, J. Peter Levin +4 more | 2000-07-18 |
| 6074571 | Cut and blast defect to avoid chrome roll over annealing | — | 2000-06-13 |
| 6048649 | Programmed defect mask with defects smaller than 0.1 .mu.m | Ann Rand Burke, Denis Rigaill | 2000-04-11 |
| 6030730 | Photomask repaired from black dot defect | — | 2000-02-29 |
| 5978501 | Adaptive inspection method and system | Karen Badger, Brian J. Grenon, David S. O'Grady | 1999-11-02 |