TT

Tohru Tsujide

FS Fab Solutions: 10 patents #4 of 7Top 60%
NE Nec: 6 patents #2,374 of 14,502Top 20%
NC Nippon Electric Co.: 4 patents #30 of 792Top 4%
TO Topcon: 3 patents #244 of 684Top 40%
Overall (All Time): #186,070 of 4,157,543Top 5%
23
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7795593 Surface contamination analyzer for semiconductor wafers Takeo Ushiki, Keizo Yamada, Yohsuke Itagaki 2010-09-14
7700380 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device Takeo Ushiki, Keizo Yamada, Yohsuke Itagaki 2010-04-20
7385195 Semiconductor device tester Keizo Yamada, Yousuke Itagaki, Takeo Ushiki 2008-06-10
7321805 Production managing system of semiconductor device Keizo Yamada, Yousuke Itagaki, Takeo Ushiki 2008-01-22
6975125 Semiconductor device tester Keizo Yamada, Yousuke Itagaki, Takeo Ushiki 2005-12-13
6946857 Semiconductor device tester Keizo Yamada, Yousuke Itagaki, Takeo Ushiki 2005-09-20
6943043 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device Takeo Ushiki, Keizo Yamada, Yohsuke Itagaki 2005-09-13
6842663 Production managing system of semiconductor device Keizo Yamada, Yousuke Itagaki, Takeo Ushiki 2005-01-11
6768324 Semiconductor device tester which measures information related to a structure of a sample in a depth direction Keizo Yamada, Yousuke Itagaki, Takeo Ushiki 2004-07-27
6753194 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device Takeo Ushiki, Keizo Yamada, Yohsuke Itagaki 2004-06-22
6711453 Production managing system of semiconductor device Keizo Yamada, Yousuke Itagaki, Takeo Ushiki 2004-03-23
6614244 Semiconductor device inspecting apparatus Keizo Yamada, Yousuke Itagaki, Takeo Ushiki 2003-09-02
6559662 Semiconductor device tester and semiconductor device test method Keizo Yamada, Yousuke Itagaki, Takeo Ushiki 2003-05-06
6133744 Apparatus for testing semiconductor wafer Masayuki Yojima, Kazuo Nakaizumi 2000-10-17
5703492 System and method for fault analysis of semiconductor integrated circuit Toyokazu Nakamura, Yasuko Hanagama, Kenji Morohashi 1997-12-30
5532610 Apparatus for testing semicondctor wafer Toshiyasu Hishii, Kazuo Nakaizumi 1996-07-02
5521516 Semiconductor integrated circuit fault analyzing apparatus and method therefor Yasuko Hanagama, Toyokazu Nakamura, Kiyoshi Nikawa 1996-05-28
5511162 Automatic LSI testing apparatus using expert system Hiroyuki Hamada, Masaaki Sugimoto 1996-04-23
4733285 Semiconductor device with input and/or output protective circuit Hiroshi Ishioka, Makoto Miyazawa 1988-03-22
4590508 MOS static ram with capacitively loaded gates to prevent alpha soft errors Noboru Hirakawa 1986-05-20
4481524 Semiconductor memory device having stacked polycrystalline silicon layers — 1984-11-06
4322736 Short-resistant connection of polysilicon to diffusion Isao Sasaki, Nobuaki Hotta 1982-03-30
4310900 Memory device with different read and write power levels — 1982-01-12