Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5703492 | System and method for fault analysis of semiconductor integrated circuit | Toyokazu Nakamura, Tohru Tsujide, Kenji Morohashi | 1997-12-30 |
| 5521516 | Semiconductor integrated circuit fault analyzing apparatus and method therefor | Toyokazu Nakamura, Kiyoshi Nikawa, Tohru Tsujide | 1996-05-28 |
| 5422498 | Apparatus for diagnosing interconnections of semiconductor integrated circuits | Kiyoshi Nikawa, Toyokazu Nakamura | 1995-06-06 |