Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6459302 | D-FF circuit | — | 2002-10-01 |
| 6429713 | D-FF circuit | — | 2002-08-06 |
| 6388473 | Logic product circuit | — | 2002-05-14 |
| 6249173 | Temperature stabilizing circuit | — | 2001-06-19 |
| 6133744 | Apparatus for testing semiconductor wafer | Masayuki Yojima, Tohru Tsujide | 2000-10-17 |
| 6031382 | Functional tester for integrated circuits | — | 2000-02-29 |
| 5532610 | Apparatus for testing semicondctor wafer | Tohru Tsujide, Toshiyasu Hishii | 1996-07-02 |
| 5058059 | Memory circuit having a redundant memory cell array for replacing faulty cells | Masahiko Matsuo | 1991-10-15 |
| 4985866 | Compound semiconductor memory device having redundant circuit configuration | — | 1991-01-15 |
| 4982111 | High speed latching circuit with level shift output circuits | — | 1991-01-01 |
| 4933903 | Static memory device provided with high-speed writing circuit | — | 1990-06-12 |
| 4878201 | Semiconductor memory device having an improved timing signal generator for the column selection circuit | — | 1989-10-31 |
| 4825415 | Signal input circuit having signal latch function | — | 1989-04-25 |
| 4688196 | Semiconductor dynamic memory device with less power consumption in internal refresh mode | Yasaburo Inagaki | 1987-08-18 |
| 4672583 | Dynamic random access memory device provided with test circuit for internal refresh circuit | — | 1987-06-09 |
| 4628218 | Driving circuit suppressing peak value of charging current from power supply to capacitive load | — | 1986-12-09 |
| 4616346 | Random access memory capable of varying a frequency in active and standby modes | Yasaburo Inagaki | 1986-10-07 |
| 4570083 | Digital circuit | — | 1986-02-11 |