Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6133744 | Apparatus for testing semiconductor wafer | Tohru Tsujide, Kazuo Nakaizumi | 2000-10-17 |
| 5392110 | Method and device for measuring height of object whose surface has irregular reflectance | Masao Kinoshita | 1995-02-21 |