Issued Patents All Time
Showing 25 most recent of 54 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10461545 | Battery system | Takeshi Inoue, Tetsuya Matsumoto | 2019-10-29 |
| 8581557 | Direct-current power source apparatus | Mitsuyoshi Kanoh, Masahiko Amano, Yukio Iida, Yoshiki Hama | 2013-11-12 |
| 8036839 | Battery state determining apparatus | Yoshiaki Machiyama, Yoshifumi Yamada, Takashi Hara | 2011-10-11 |
| 7795593 | Surface contamination analyzer for semiconductor wafers | Takeo Ushiki, Yohsuke Itagaki, Tohru Tsujide | 2010-09-14 |
| 7700380 | Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device | Takeo Ushiki, Yohsuke Itagaki, Tohru Tsujide | 2010-04-20 |
| 7649341 | Storage battery unit | Shun Kobuse, Yoshiaki Machiyama, Kouji Ohtsu | 2010-01-19 |
| 7550982 | Semiconductor device test method for comparing a first area with a second area | — | 2009-06-23 |
| 7420379 | Semiconductor device test method and semiconductor device tester | — | 2008-09-02 |
| 7385195 | Semiconductor device tester | Yousuke Itagaki, Takeo Ushiki, Tohru Tsujide | 2008-06-10 |
| 7321805 | Production managing system of semiconductor device | Yousuke Itagaki, Takeo Ushiki, Tohru Tsujide | 2008-01-22 |
| 7232994 | Contact hole standard test device, method of forming the same, method of testing contact hole, method and apparatus for measuring a thickness of a film, and method of testing a wafer | — | 2007-06-19 |
| 7049834 | Semiconductor device test method and semiconductor device tester | — | 2006-05-23 |
| 7002361 | Film thickness measuring apparatus and a method for measuring a thickness of a film | Yousuke Itagaki, Takeo Ushiki | 2006-02-21 |
| 6982418 | Contact hole standard test device, method of forming the same, method of testing contact hole, method and apparatus for measuring a thickness of a film, and method of testing a wafer | — | 2006-01-03 |
| 6975125 | Semiconductor device tester | Yousuke Itagaki, Takeo Ushiki, Tohru Tsujide | 2005-12-13 |
| 6967327 | Contact hole standard test device, method of forming the same, method testing contact hole, method and apparatus for measuring a thickness of a film, and method of testing a wafer | — | 2005-11-22 |
| 6946857 | Semiconductor device tester | Yousuke Itagaki, Takeo Ushiki, Tohru Tsujide | 2005-09-20 |
| 6943043 | Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device | Takeo Ushiki, Yohsuke Itagaki, Tohru Tsujide | 2005-09-13 |
| 6940296 | Contact hole standard test device, method of forming the same, method of testing contact hole, method and apparatus for measuring a thickness of a film, and method of testing a wafer | — | 2005-09-06 |
| 6914444 | Semiconductor device test method and semiconductor device tester | — | 2005-07-05 |
| 6900645 | Semiconductor device test method and semiconductor device tester | — | 2005-05-31 |
| 6897440 | Contact hole standard test device | — | 2005-05-24 |
| 6850079 | Film thickness measuring apparatus and a method for measuring a thickness of a film | Yousuke Itagaki, Takeo Ushiki | 2005-02-01 |
| 6842663 | Production managing system of semiconductor device | Yousuke Itagaki, Takeo Ushiki, Tohru Tsujide | 2005-01-11 |
| 6837936 | Semiconductor manufacturing device | Takeo Ushiki, Yousuke Itagaki | 2005-01-04 |