Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7795593 | Surface contamination analyzer for semiconductor wafers | Takeo Ushiki, Keizo Yamada, Tohru Tsujide | 2010-09-14 |
| 7700380 | Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device | Takeo Ushiki, Keizo Yamada, Tohru Tsujide | 2010-04-20 |
| 6943043 | Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device | Takeo Ushiki, Keizo Yamada, Tohru Tsujide | 2005-09-13 |
| 6753194 | Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device | Takeo Ushiki, Keizo Yamada, Tohru Tsujide | 2004-06-22 |