Issued Patents All Time
Showing 1–25 of 29 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12227642 | Polymer gel having sponge-like porous structure | Yuichi Tei | 2025-02-18 |
| 10550225 | Process for producing low-concentration gel using gel-precursor clusters, and gel obtained by said production process | Yuichi Tei | 2020-02-04 |
| 7869062 | Apparatus for supporting substrate, apparatus for measuring surface potential, apparatus for measuring film thickness, and apparatus for inspecting substrate | Yoshiyuki Nakazawa | 2011-01-11 |
| 7539097 | Optical disk device | Youichi Ogura, Toshihiko Takahashi, Teruhiko Izumi, Shinichi Konishi, Hironori Deguchi | 2009-05-26 |
| 7190643 | Land pre-pit address demodulating device | Akihiro Shibata, Dai Ichiryu | 2007-03-13 |
| 7073521 | Substrate processing apparatus comprising ring-shaped motor | — | 2006-07-11 |
| 6598805 | Substrate cleaning apparatus | Sadao Hirae | 2003-07-29 |
| 5857474 | Method of and apparatus for washing a substrate | Sadao Hirae, Minobu Matsunaga | 1999-01-12 |
| 5554939 | Non-destructive measuring sensor for semiconductor wafer and method of manufacturing the same | Sadao Hirae, Hideaki Matsubara, Motohiro Kouno | 1996-09-10 |
| 5444389 | Method and apparatus for measuring lifetime of minority carriers in semiconductor | Sadao Hirae, Motohiro Kouno | 1995-08-22 |
| 5239183 | Optical gap measuring device using frustrated internal reflection | Motohiro Kouno, Ikuyoshi Nakatani, Sadao Hirae | 1993-08-24 |
| 5233291 | Method of and apparatus for measuring electric characteristics of semiconductor wafer | Motohiro Kouno, Ikuyoshi Nakatani | 1993-08-03 |
| 5225690 | Gap measuring device and method using frustrated internal reflection | Motohiro Kouno, Sadao Hirae, Ikuyoshi Nakatani | 1993-07-06 |
| 4883424 | Apparatus for heat treating substrates | Yuusuke Muraoka | 1989-11-28 |
| 4849608 | Apparatus for heat-treating wafers | Yusuke Muraoka, Atsushi Tamada, Hitoshi Haibara, Keiji Nakagawa | 1989-07-18 |
| 4803948 | Heat processing apparatus for semiconductor manufacturing | Keiji Nakagawa, Ikuyoshi Nakatani, Yusuke Muraoka | 1989-02-14 |
| 4798926 | Method of heating semiconductor and susceptor used therefor | — | 1989-01-17 |
| 4746857 | Probing apparatus for measuring electrical characteristics of semiconductor device formed on wafer | Motohiro Kono, Takayuki Umaba, Yoshiyuki Nakagawa, Yoshihiro Koyama | 1988-05-24 |
| 4693208 | Feeder of oxygen gas containing steam | — | 1987-09-15 |
| 4630082 | Semiconductor device with multi-electrode construction equivalent to variable capacitance diode | — | 1986-12-16 |
| 4529995 | Variable capacitance device | Shoichi Minagawa | 1985-07-16 |
| 4529994 | Variable capacitor with single depletion layer | — | 1985-07-16 |
| 4473767 | Surface acoustic wave convolver with depletion layer control | Shoichi Minagawa, Takeshi Okamoto | 1984-09-25 |
| 4466876 | Thin layer depositing apparatus | Yasuhiko Sato | 1984-08-21 |
| 4456917 | Variable capacitor | Yasuo Sato | 1984-06-26 |