| 10090394 |
Ohmic contact structure for group III nitride semiconductor device having improved surface morphology and well-defined edge features |
Helmut Hagleitner |
2018-10-02 |
| 9607955 |
Contact pad |
Van Mieczkowski, Zoltan Ring, Helmut Hagleitner |
2017-03-28 |
| 9548206 |
Ohmic contact structure for group III nitride semiconductor device having improved surface morphology and well-defined edge features |
Helmut Hagleitner |
2017-01-17 |
| 9396946 |
Wet chemistry processes for fabricating a semiconductor device with increased channel mobility |
Sarit Dhar, Lin Cheng, Sei-Hyung Ryu, Anant Agarwal, John Williams Palmour +2 more |
2016-07-19 |
| 9269580 |
Semiconductor device with increased channel mobility and dry chemistry processes for fabrication thereof |
Sarit Dhar, Lin Cheng, Sei-Hyung Ryu, Anant Agarwal, John Williams Palmour |
2016-02-23 |
| 8810355 |
Thin film resistor |
Van Mieczkowski |
2014-08-19 |
| 8570140 |
Thin film resistor |
Van Mieczkowski |
2013-10-29 |
| 8563372 |
Methods of forming contact structures including alternating metal and silicon layers and related devices |
Helmut Hagleitner, Zoltan Ring, Scott Sheppard, Jason Henning, Dan Namishia |
2013-10-22 |