Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11439997 | Neutral complex cleaning solution and regeneration method for denitration catalyst with calcium poisoning | Junhua Li, Xiansheng Li, Xiang Li, Jianjun Chen | 2022-09-13 |
| 11161106 | Preparation method of denitration catalyst with wide operating temperature range for flue gas | Junhua Li, Lina Gan, Shuangjiang Yu, Dong Wang, Jianjun Chen | 2021-11-02 |
| 11121093 | Methods for selectively forming identification mark on semiconductor wafer | Cheng-Yi Huang, Fu-Jen Li, Shou-Wen Kuo | 2021-09-14 |
| 10643951 | Mini identification mark in die-less region of semiconductor wafer | Cheng-Yi Huang, Fu-Jen Li, Shou-Wen Kuo | 2020-05-05 |
| 10261427 | Metrology method and apparatus, computer program and lithographic system | Si-Han Zeng, Jen-Yu Fang, Arie Jeffrey Den Boef, Alexander Straaijer, Ching-Yi Hung +1 more | 2019-04-16 |
| 9879988 | Metrology method and apparatus, computer program and lithographic system | Xing Lan Liu, Hendrik Jan Hidde Smilde, Hakki Ergün Cekli, Josselin Pello, Richard Johannes Franciscus Van Haren | 2018-01-30 |
| 9869940 | Metrology method and apparatus, computer program and lithographic system | Si-Han Zeng, Jen-Yu Fang, Arie Jeffrey Den Boef, Alexander Straaijer, Ching-Yi Hung +1 more | 2018-01-16 |
| 5687010 | Dual motion scanning method and apparatus therefor | Cornelis Van Tilborg, Eduardus J. W. van Vliembergen, Gerardus Gertruda Johannes Catharina Kessels, Jacobus J. Kandelaars | 1997-11-11 |