Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11686680 | Apparatus for exploring an optical property of a sample | Valerio Pruneri, Roland Alfonso Terborg, Marc JOFRE, Pedro Martinez | 2023-06-27 |
| 9879988 | Metrology method and apparatus, computer program and lithographic system | Xing Lan Liu, Hendrik Jan Hidde Smilde, Yue-Lin Peng, Hakki Ergün Cekli, Richard Johannes Franciscus Van Haren | 2018-01-30 |