Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12204826 | Method and apparatus for inspection and metrology | Lotte Marloes Willems, Kaustuve Bhattacharyya, Panagiotis Pieter Bintevinos, Guangqing Chen, Martin Ebert +5 more | 2025-01-21 |
| 11580274 | Method and apparatus for inspection and metrology | Lotte Marloes Willems, Kaustuve Bhattacharyya, Panagiotis Pieter Bintevinos, Guangqing Chen, Martin Ebert +5 more | 2023-02-14 |
| 8908147 | Method and apparatus for determining an overlay error | Arie Jeffrey Den Boef, Maurits Van Der Schaar, Andreas Fuchs, Martyn John Coogans, Kaustuve Bhattacharyya +1 more | 2014-12-09 |