Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12386268 | Method for calibrating simulation process based on defect-based process window | Koenraad VAN INGEN SCHENAU, Abraham SLACHTER, Vadim Yourievich TIMOSHKOV, Marleen KOOIMAN, Marie-Claire VAN LARE +5 more | 2025-08-12 |
| 7471375 | Correction of optical proximity effects by intensity modulation of an illumination arrangement | Jozef Maria Finders, Steven George Hansen | 2008-12-30 |
| 7466413 | Marker structure, mask pattern, alignment method and lithographic method and apparatus | Jozef Maria Finders, Mircea Dusa, Richard Johannes Franciscus Van Haren, Eric Henri Jan Hendrickx, Geert Vandenberghe +1 more | 2008-12-16 |