Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11961700 | Systems and methods for image enhancement for a multi-beam charged-particle inspection system | Maikel Robert GOOSEN, Albertus Victor Gerardus MANGNUS | 2024-04-16 |
| 11302512 | Electron beam inspection apparatus stage positioning | Marcel Koenraad Marie Baggen, Antonius Henricus Arends, Johannes Hubertus Antonius Van De Rijdt, Peter Paul HEMPENIUS, Robertus Jacobus Theodorus Van Kempen +5 more | 2022-04-12 |
| 10649347 | Lithographic apparatus and device manufacturing method | Michaël Johannes Christiaan RONDE, Niels Johannes Maria Bosch, Hans Butler, Cornelius Adrianus Lambertus De Hoon, Marc Wilhelmus Maria Van Der Wijst +2 more | 2020-05-12 |