Issued Patents All Time
Showing 26–50 of 50 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7023525 | Imaging apparatus | Arno Jan Bleeker, Pieter Willem Herman De Jager, Jason Hintersteiner, Borgert Kruizinga, Matthew Eugene McCarthy +6 more | 2006-04-04 |
| 6989920 | System and method for dose control in a lithographic system | Jason Hintersteiner, Arno Jan Bleeker | 2006-01-24 |
| 6946654 | Collection of secondary electrons through the objective lens of a scanning electron microscope | Robert L. Gerlach, Michael R. Scheinfein | 2005-09-20 |
| 6930755 | Lithographic apparatus and device manufacturing method | — | 2005-08-16 |
| 6778257 | Imaging apparatus | Arno Jan Bleeker, Pieter Willem Herman De Jager, Jason Hintersteiner, Borgert Kruizinga, Matthew Eugene McCarthy +6 more | 2004-08-17 |
| 6633366 | Lithographic apparatus, device manufacturing method, and device manufactured thereby | Pieter Willem Herman De Jager, Pieter Kruit, Arno Jan Bleeker | 2003-10-14 |
| 6365896 | Environmental SEM with a magnetic field for improved secondary electron direction | — | 2002-04-02 |
| 6191423 | Correction device for correcting the spherical aberration in particle-optical apparatus | Marcellinus Krijn | 2001-02-20 |
| 6184525 | Environmental SEM with a multiple fields for improved secondary electron detection | — | 2001-02-06 |
| 5986269 | Correction device for correcting chromatic aberration in particle-optical apparatus | Marcellinus P. C. M. Krijn, Alexander Henstra | 1999-11-16 |
| 5986270 | Particle-optical apparatus including a low-temperature specimen holder | Bernardus Jacobus Marie Bormans, Alan Frank de Jong, Raymond Wagner, Peter E. S. J. Asselbergs | 1999-11-16 |
| 5578822 | Particle-optical apparatus comprising a detector for secondary electrons | Pieter Kruit, Kars Z. Troost, Alexander Henstra | 1996-11-26 |
| 5336885 | Electron beam apparatus | Harald Rose, Ralf Degenhardt | 1994-08-09 |
| 5300775 | Method of selecting a spatial energy spread within an electron beam, and an electron beam apparatus suitable for carrying out such a method | — | 1994-04-05 |
| 5221844 | Charged particle beam device | Alan Frank de Jong | 1993-06-22 |
| 5001349 | Charged-particle beam apparatus | — | 1991-03-19 |
| 4977324 | Charged particle beam apparatus | Pieter Kruit | 1990-12-11 |
| 4902930 | Electron image projector | — | 1990-02-20 |
| 4871911 | Electron beam apparatus comprising a semiconductor electron emitter | Gerardus G. P. Van Gorkom, Arthur M. E. Hoeberechts, Harm Tolner | 1989-10-03 |
| 4823013 | Charged particles exposure apparatus having an optically deformable beam bounding diaphragm | — | 1989-04-18 |
| 4820921 | Method of beam centering | Johan G. Bakker | 1989-04-11 |
| 4789780 | Apparatus for energy-selective visualization | Jan B. Le Poole | 1988-12-06 |
| 4766340 | Semiconductor device having a cold cathode | Arthur M. E. Hoeberechts, Gerardus G. P. Van Gorkom | 1988-08-23 |
| 4618766 | Automatically adjustable electron microscope | Ulrich Gross | 1986-10-21 |
| 4306149 | Electron microscope (comprising an auxiliary lens) | Jan B. Le Poole, Christiaan J. Rakels | 1981-12-15 |