Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7625692 | Yield and line width performance for liquid polymers and other materials | Emir Gurer, Murthy Krishna, Reese Reynolds, John Salois, Royal Cherry | 2009-12-01 |
| 7255975 | Yield and line width performance for liquid polymers and other materials | Emir Gurer, Murthy Krishna, Reese Reynolds, John Salois, Royal Cherry | 2007-08-14 |
| 7208262 | Yield and line width performance for liquid polymers and other materials | Emir Gurer, Murthy Krishna, Reese Reynolds, John Salois, Royal Cherry | 2007-04-24 |
| 6977098 | Method of uniformly coating a substrate | Emir Gurer, Tom Zhong, John Lewellen, Robert P. Mandal, James C. Grambow +3 more | 2005-12-20 |
| 6955720 | Plasma deposition of spin chucks to reduce contamination of Silicon wafers | Emir Gurer, Richard Savage | 2005-10-18 |
| 6911091 | Environment exchange control for material on a wafer surface | Emir Gurer, Tom Zhong, Kevin Golden, John Lewellen, Scott C. Wackerman +1 more | 2005-06-28 |
| 6905547 | Method and apparatus for flexible atomic layer deposition | Ana R. Londergan, Thomas E. Seidel, Lawrence D. Matthysse | 2005-06-14 |
| 6844027 | Environment exchange control for material on a wafer surface | Emir Gurer, Tom Zhong, Kevin Golden, John Lewellen, Scott C. Wackerman +1 more | 2005-01-18 |
| 6780461 | Environment exchange control for material on a wafer surface | Emir Gurer, Tom Zhong, Kevin Golden, John Lewellen, Scott C. Wackerman +1 more | 2004-08-24 |
| 6669779 | Yield and line width performance for liquid polymers and other materials | Emir Gurer, Murthy Krishna, Reese Reynolds, John Salois, Royal Cherry | 2003-12-30 |
| 6468586 | Environment exchange control for material on a wafer surface | Emir Gurer, Tom Zhong, Kevin Golden, John Lewellen, Scott C. Wackerman +1 more | 2002-10-22 |
| 6254936 | Environment exchange control for material on a wafer surface | Emir Gurer, Tom Zhong, Kevin Golden, John Lewellen, Reese Reynolds +1 more | 2001-07-03 |
| 6248171 | Yield and line width performance for liquid polymers and other materials | Emir Gurer, Murthy Krishna, Reese Reynolds, John Salois, Royal Cherry | 2001-06-19 |
| 6242364 | Plasma deposition of spin chucks to reduce contamination of silicon wafers | Emir Gurer, Richard Savage | 2001-06-05 |
| 4566026 | Integrated circuit bimetal layer | Jon A. Roberts | 1986-01-21 |