CP

Charles G. Potter

Applied Materials: 11 patents #1,198 of 7,310Top 20%
Overall (All Time): #432,034 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12215966 Methods and systems of optical inspection of electronic device manufacturing machines Mohsin Waqar, Paul Z. Wirth, Todd James Brill, Paul Fisher, Ilias Iliopoulos 2025-02-04
11978647 Method and apparatus for measuring erosion and calibrating position for a moving process kit Eli Mor, Sergio Lopez Carbajal 2024-05-07
11908724 Method and apparatus for measuring placement of a substrate on a heater pedestal Anthony D. Vaughan 2024-02-20
11521872 Method and apparatus for measuring erosion and calibrating position for a moving process kit Eli Mor, Sergio Lopez Carbajal 2022-12-06
11404296 Method and apparatus for measuring placement of a substrate on a heater pedestal Anthony D. Vaughan 2022-08-02
11387122 Method and apparatus for measuring process kit centering Eli Mor 2022-07-12
11342210 Method and apparatus for measuring wafer movement and placement using vibration data Terrance Allen Neal 2022-05-24
11054317 Method and apparatus for direct measurement of chucking force on an electrostatic chuck Wendell Glenn Boyd, Jr., Govinda Raj, Robert T. Hirahara 2021-07-06
10847393 Method and apparatus for measuring process kit centering Eli Mor 2020-11-24
10794681 Long range capacitive gap measurement in a wafer form sensor system Eli Mor 2020-10-06
10522380 Method and apparatus for determining substrate placement in a process chamber 2019-12-31