Issued Patents All Time
Showing 26–50 of 67 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6714294 | De broglie microscope | Michael R. Bruce, Victoria J. Bruce | 2004-03-30 |
| 6709985 | Arrangement and method for providing an imaging path using a silicon-crystal damaging laser | Michael R. Bruce | 2004-03-23 |
| 6686757 | Defect detection in semiconductor devices | Rosalinda M. Ring, Brennan V. Davis, Jeffrey D. Birdsley, Michael R. Bruce | 2004-02-03 |
| 6657446 | Picosecond imaging circuit analysis probe and system | Antonio Torres Garcia, Michael R. Bruce | 2003-12-02 |
| 6653849 | IC analysis involving logic state mapping in a SOI die | Michael R. Bruce | 2003-11-25 |
| 6635572 | Method of substrate silicon removal for integrated circuit devices | Richard W. Johnson, Rosalinda M. Ring | 2003-10-21 |
| 6621288 | Timing margin alteration via the insulator of a SOI die | Michael R. Bruce | 2003-09-16 |
| 6608494 | Single point high resolution time resolved photoemission microscopy system and method | Michael R. Bruce | 2003-08-19 |
| 6566888 | Repair of resistive electrical connections in an integrated circuit | Michael R. Bruce, Glen Gilfeather | 2003-05-20 |
| 6529029 | Magnetic resonance imaging of semiconductor devices | Michael R. Bruce, Jeffrey D. Birdsley, Rosalinda M. Ring, Brennan V. Davis | 2003-03-04 |
| 6518783 | Circuit construction in back side of die and over a buried insulator | Jeffrey D. Birdsley, Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring, Daniel L. Stone | 2003-02-11 |
| 6483327 | Quadrant avalanche photodiode time-resolved detection | Michael R. Bruce, Victoria J. Bruce, Jeffrey D. Birdsley, Rosalinda M. Ring, Brennan V. Davis | 2002-11-19 |
| 6483326 | Localized heating for defect isolation during die operation | Michael R. Bruce, Richard W. Johnson | 2002-11-19 |
| 6469529 | Time-resolved emission microscopy system | Michael R. Bruce, Glen Gilfeather | 2002-10-22 |
| 6455334 | Probe grid for integrated circuit analysis | Jeffrey D. Birdsley, Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring, Glen Gilfeather | 2002-09-24 |
| 6433572 | Intergrated circuit integrity analysis as a function of magnetic field decay | Jeffrey D. Birdsley, Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring | 2002-08-13 |
| 6430728 | Acoustic 3D analysis of circuit structures | Jeffrey D. Birdsley, Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring | 2002-08-06 |
| 6421811 | Defect detection via acoustic analysis | Jeffrey D. Birdsley, Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring | 2002-07-16 |
| 6417680 | Method and apparatus for stress testing a semiconductor device using laser-induced circuit excitation | Jeffrey D. Birdsley, Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring | 2002-07-09 |
| 6414335 | Selective state change analysis of a SOI die | Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring, Daniel L. Stone, Jeffrey D. Birdsley | 2002-07-02 |
| 6391664 | Selectively activatable solar cells for integrated circuit analysis | Jeffrey D. Birdsley, Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring | 2002-05-21 |
| 6387715 | Integrated circuit defect detection via laser heat and IR thermography | Brennan V. Davis, Jeffrey D. Birdsley, Michael R. Bruce, Rosalinda M. Ring | 2002-05-14 |
| 6372529 | Forming elongated probe points useful in testing semiconductor devices | Rosalinda M. Ring, Brennan V. Davis, Jeffrey D. Birdsley, Michael R. Bruce | 2002-04-16 |
| 6352871 | Probe grid for integrated circuit excitation | Jeffrey D. Birdsley, Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring, Glen Gilfeather | 2002-03-05 |
| 6350624 | Substrate removal as a functional of sonic analysis | Jeffrey D. Birdsley, Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring | 2002-02-26 |