Issued Patents All Time
Showing 1–22 of 22 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8117521 | Implementation of recycling unused ECC parity bits during flash memory programming | Allan Parker, Tan Tat Hin, Murni Mohd-Salleh | 2012-02-14 |
| 7057949 | Method and apparatus for pre-charging negative pump MOS regulation capacitors | Feng Pan, Weng Fook Lee, Santosh Yachareni | 2006-06-06 |
| 7028240 | Diagnostic mode for testing functionality of BIST (built-in-self-test) back-end state machine | Ken Cheong Cheah, Colin S. Bill | 2006-04-11 |
| 7010736 | Address sequencer within BIST (Built-in-Self-Test) system | Boon Tang Teh, Ken Cheong Cheah, Colin S. Bill, Joseph Kucera, Weng Fook Lee +1 more | 2006-03-07 |
| 6980473 | Memory device and method | Ken Cheong Cheah, Chi Mun Ho | 2005-12-27 |
| 6973003 | Memory device and method | Syahrizal Salleh, Ken Cheong Cheah | 2005-12-06 |
| 6970368 | CAM (content addressable memory) cells as part of core array in flash memory device | Ken Cheong Cheah | 2005-11-29 |
| 6891752 | System and method for erase voltage control during multiple sector erase of a flash memory device | Ken Cheong Cheah, Weng Fook Lee | 2005-05-10 |
| 6771093 | Implementing reference current measurement mode within reference array programming mode or reference array erase mode in a semiconductor | Ken Cheong Cheah, Weng Fook Lee | 2004-08-03 |
| 6665214 | On-chip erase pulse counter for efficient erase verify BIST (built-in-self-test) mode | Ken Cheong Cheah, Weng Fook Lee, Boon Tang Teh | 2003-12-16 |
| 6631086 | On-chip repair of defective address of core flash memory cells | Colin S. Bill, Ken Cheong Cheah, Azrul Halim, Darlene Hamilton | 2003-10-07 |
| 6622274 | Method of micro-architectural implementation on bist fronted state machine utilizing ‘death logic’ state transition for area minimization | Weng Fook Lee, Colin S. Bill, Feng Pan | 2003-09-16 |
| 6587982 | Method of micro-architectural implementation of interface between bist state machine and tester interface to enable bist cycling | Weng Fook Lee, Colin S. Bill, Feng Pan, Azrul Halim | 2003-07-01 |
| 6549477 | System and method to facilitate stabilization of reference voltage signals in memory devices | Weng Fook Lee, Santosh Yachareni | 2003-04-15 |
| 6532175 | Method and apparatus for soft program verification in a memory device | Santosh Yachareni, Weng Fook Lee | 2003-03-11 |
| 6459628 | System and method to facilitate stabilization of reference voltage signals in memory devices | Weng Fook Lee, Santosh Yachareni | 2002-10-01 |
| 6385093 | I/O partitioning system and methodology to reduce band-to-band tunneling current during erase | Kazuhiro Kurihara, Feng Pan, Weng Fook Lee, Ravi Sunkavalli, Darlene Hamilton | 2002-05-07 |
| 6331951 | Method and system for embedded chip erase verification | Darlene Hamilton, Weng Fook Lee, Pau-Ling Chen, Keith H. Wong | 2001-12-18 |
| 6324108 | Application of external voltage during array VT testing | Colin S. Bill, Shigekazu Yamada | 2001-11-27 |
| 6285594 | Wordline voltage protection | Colin S. Bill, Santosh Yachareni | 2001-09-04 |
| 6269026 | Charge sharing to help boost the wordlines during APDE verify | Bhimachar Venkatesh | 2001-07-31 |
| 6212098 | Voltage protection of write protect cams | Santosh Yachareni | 2001-04-03 |