| 7010736 |
Address sequencer within BIST (Built-in-Self-Test) system |
Edward V. Bautista, Jr., Ken Cheong Cheah, Colin S. Bill, Joseph Kucera, Weng Fook Lee +1 more |
2006-03-07 |
| 6665214 |
On-chip erase pulse counter for efficient erase verify BIST (built-in-self-test) mode |
Ken Cheong Cheah, Edward V. Bautista, Jr., Weng Fook Lee |
2003-12-16 |
| 6507527 |
Memory line discharge before sensing |
Lee Cleveland, Jin-Lien Lin, Takao Akaogi, Ali Al-Shamma, Kendra Nguyen +1 more |
2003-01-14 |
| 6351420 |
Voltage boost level clamping circuit for a flash memory |
Takao Akaogi, Ali Al-Shamma, Lee Cleveland, Yong-Kyu Kim, Jin-Lien Lin +1 more |
2002-02-26 |
| 6347052 |
Word line decoding architecture in a flash memory |
Takao Akaogi, Ali Al-Shamma, Lee Cleveland, Yong-Kyu Kim, Jin-Lien Lin +1 more |
2002-02-12 |
| 6243316 |
Voltage boost reset circuit for a flash memory |
Takao Akaogi, Ali Al-Shamma, Lee Cleveland, Yong-Kyu Kim, Jin-Lien Lin +1 more |
2001-06-05 |
