Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6707718 | Generation of margining voltage on-chip during testing CAM portion of flash memory device | Colin S. Bill, Ken Cheong Cheah, Syahrizal Salleh | 2004-03-16 |
| 6631086 | On-chip repair of defective address of core flash memory cells | Colin S. Bill, Ken Cheong Cheah, Edward V. Bautista, Jr., Darlene Hamilton | 2003-10-07 |
| 6587982 | Method of micro-architectural implementation of interface between bist state machine and tester interface to enable bist cycling | Weng Fook Lee, Colin S. Bill, Feng Pan, Edward V. Bautista, Jr. | 2003-07-01 |