Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10761137 | Flexible manufacturing flow enabled by adaptive binning system | Lee N. Chung, Randy J. Simmons, Dahshi Shen, Felino E. Pagaduan, Tony Le | 2020-09-01 |
| 7493543 | Determining timing associated with an input or output of an embedded circuit in an integrated circuit for testing | Vickie Youmin Wu | 2009-02-17 |
| 6671848 | Test circuit for exposing higher order speed paths | Jason Mulig | 2003-12-30 |
| 6546513 | Data processing device test apparatus and method therefor | Richard Wilcox, Jason Mulig, David H. Eppes, Michael R. Bruce, Victoria J. Bruce +4 more | 2003-04-08 |
| 6468917 | Method for modifying a C4 semiconductor device | Susan Xia Li, Maria Guardado | 2002-10-22 |