Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Determining timing associated with an input or output of an embedded circuit in an integrated circuit for testing

Determining timing associated with an input or output of an embedded circuit in an integrated circuit for testing

US Patent 7493543 · Granted Feb 17, 2009

Estimated economic value: $6,048,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and apparatus for adjusting video brightness2025
Machine learning-based object-centric approach to image manipulation2025
Real-time low latency computer vision/machine learning compute accelerator with 2023
Flexible manufacturing flow enabled by adaptive binning system2020
Power saving techniques for image sensors2016
Test circuit for exposing higher order speed paths2003
Data processing device test apparatus and method therefor2003
Method for modifying a C4 semiconductor device2002