Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10761137 | Flexible manufacturing flow enabled by adaptive binning system | Randy J. Simmons, Arnold Louie, Dahshi Shen, Felino E. Pagaduan, Tony Le | 2020-09-01 |
| 9091727 | Configuration and testing of multiple-die integrated circuits | Julian Lupu, Shivani C. Desai, Teymour M. Mansour | 2015-07-28 |
| 8030954 | Internal voltage level shifting for screening cold or hot temperature defects using room temperature testing | Srinivasa R. Parthasarathy, Jian Shi, Randy J. Simmons | 2011-10-04 |
| 7302625 | Built-in self test (BIST) technology for testing field programmable gate arrays (FPGAs) using partial reconfiguration | Tassanee Payakapan, Shahin Toutounchi | 2007-11-27 |