Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7761755 | Circuit for and method of testing for faults in a programmable logic device | Ismed D. Hartanto, Shahin Toutounchi | 2010-07-20 |
| 7725787 | Testing of a programmable device | Robert W. Wells, Shekhar Bapat, Shahin Toutounchi | 2010-05-25 |
| 7454675 | Testing of a programmable device | Robert W. Wells, Shekhar Bapat, Shahin Toutounchi | 2008-11-18 |
| 7302625 | Built-in self test (BIST) technology for testing field programmable gate arrays (FPGAs) using partial reconfiguration | Lee N. Chung, Shahin Toutounchi | 2007-11-27 |