TO

Toshiyuki Okayasu

AD Advantest: 118 patents #1 of 1,193Top 1%
NU National University Corporation Tohoku University: 3 patents #28 of 170Top 20%
FC Furukawa Electric Co.: 2 patents #850 of 2,370Top 40%
📍 Goka, JP: #1 of 8 inventorsTop 15%
Overall (All Time): #10,394 of 4,157,543Top 1%
118
Patents All Time

Issued Patents All Time

Showing 76–100 of 118 patents

Patent #TitleCo-InventorsDate
7002243 Signal transmission circuit, CMOS semiconductor device, and circuit board 2006-02-21
6987410 Clock recovery circuit and communication device Masakatsu Suda, Satoshi Sudou 2006-01-17
6967516 Semiconductor testing apparatus with a variable delay circuit 2005-11-22
6944835 Delay circuit, testing apparatus, and capacitor 2005-09-13
6940330 Timing generator, semiconductor test apparatus, and timing generating method 2005-09-06
6842061 Timing generating apparatus and test apparatus Masakatsu Suda 2005-01-11
6822267 Signal transmission circuit, CMOS semiconductor device, and circuit board 2004-11-23
6819876 Optical pulse transmission system, optical pulse transmitting method and optical pulse detection method Nobuhito Kishi 2004-11-16
6807243 Delay clock generating apparatus and delay time measuring apparatus Shinya Sato 2004-10-19
6778783 Optical pulse transmission system, optical pulse transmitting method and optical pulse detecting method Nobuhito Kishi 2004-08-17
6769082 Delay device, semiconductor testing device, semiconductor device, and oscilloscope Masakatsu Suda 2004-07-27
6651179 Delay time judging apparatus Shinya Sato, Masatoshi Sato 2003-11-18
6597753 Delay clock generating apparatus and delay time measuring apparatus Shinya Sato 2003-07-22
6598212 Delay circuit, testing apparatus, and capacitor 2003-07-22
6590405 CMOS integrated circuit and timing signal generator using same 2003-07-08
6586924 Method for correcting timing for IC tester and IC tester having correcting function using the correcting method Nobusuke Seki 2003-07-01
6586953 Optically driven driver, optical output type voltage sensor, and IC testing equipment using these devices 2003-07-01
6549052 Variable delay circuit 2003-04-15
6469514 Timing calibration apparatus and method in a semiconductor integrated circuit tester 2002-10-22
6462598 Delay time control circuit Takashi Sekino 2002-10-08
6433567 CMOS integrated circuit and timing signal generator using same 2002-08-13
6420921 Delay signal generating apparatus and semiconductor test apparatus Hiroshi Tsukahara 2002-07-16
6396610 Semiconductor integrated circuit 2002-05-28
6381054 Optical pulse transmission system, optical pulse transmitting method, and optical pulse detecting method Nobuhito Kishi 2002-04-30
6313677 Signal transmission circuit, CMOS semiconductor device, and circuit board 2001-11-06