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Nobusuke Seki

AD Advantest: 3 patents #330 of 1,193Top 30%
Overall (All Time): #1,566,331 of 4,157,543Top 40%
3
Patents All Time

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
7656177 Test apparatus 2010-02-02
6586924 Method for correcting timing for IC tester and IC tester having correcting function using the correcting method Toshiyuki Okayasu 2003-07-01
6064248 Clock pulse transmission circuit 2000-05-16