Issued Patents All Time
Showing 51–75 of 118 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7699538 | Hermetically sealing member having optical transmission means, optoelectronic apparatus, and optical transmission method | Yusuke Hayase, Atsushi Ono | 2010-04-20 |
| 7684944 | Calibration apparatus, calibration method, and testing apparatus | Masahiro Ishida | 2010-03-23 |
| 7679391 | Test equipment and semiconductor device | Daisuke Watanabe | 2010-03-16 |
| 7676343 | Transfer measurement circuit | Daisuke Watanabe | 2010-03-09 |
| 7642797 | Power supply stabilizing circuit, an electronic device and a test apparatus | Shoji Kojima | 2010-01-05 |
| 7603241 | Light receiving apparatus, testing apparatus, light receiving method, testing method, test module and semiconductor chip | Daisuke Watanabe | 2009-10-13 |
| 7555038 | Transmission system, signal receiver, test apparatus and test head | Daisuke Watanabe | 2009-06-30 |
| 7509058 | Data transmission apparatus, photoelectric conversion circuit and test apparatus | Atsushi Ono | 2009-03-24 |
| 7502980 | Signal generator, test apparatus, and circuit device | Daisuke Watanabe | 2009-03-10 |
| 7475319 | Threshold voltage control apparatus, test apparatus, and circuit device | Daisuke Watanabe | 2009-01-06 |
| 7469196 | Measuring a characteristic of a transfer circuit | Daisuke Watanabe | 2008-12-23 |
| 7453289 | Transmission circuit, CMOS semiconductor device, and design method thereof | Kazuhiro Yamamoto | 2008-11-18 |
| 7394328 | Oscillator circuit and test apparatus | Daisuke Watanabe | 2008-07-01 |
| 7389190 | Testing apparatus for testing a device under test and comparator circuit and calibration apparatus for the testing apparatus | Yoshiharu Umemura, Toshiaki Awaji, Masahiro Yamakawa | 2008-06-17 |
| 7349617 | Test apparatus and cable guide unit | Masashi Shibata, Tsutomu Akiyama | 2008-03-25 |
| 7336885 | Test apparatus, optical coupler and method of manufacturing same | Atsushi Ono, Akihiro Fujimoto, Masashi Shibata | 2008-02-26 |
| 7332926 | Semiconductor test apparatus | Masatoshi Ohashi | 2008-02-19 |
| 7321249 | Oscillator, frequency multiplier, and test apparatus | Daisuke Watanabe | 2008-01-22 |
| 7316578 | Electronic device test apparatus with optical cables | Atsushi Ono, Akihiro Fujimoto, Masashi Shibata | 2008-01-08 |
| 7286742 | Test apparatus and cable guide unit | Masashi Shibata, Tsutomu Akiyama | 2007-10-23 |
| 7209668 | Data transmission apparatus, photoelectric conversion circuit and test apparatus | Atsushi Ono | 2007-04-24 |
| 7142031 | Delay device, semiconductor testing device, semiconductor device, and oscilloscope | Masakatsu Suda | 2006-11-28 |
| 7126366 | Semiconductor test apparatus | Masatoshi Ohashi | 2006-10-24 |
| 7071746 | Variable delay circuit | Masakatsu Suda, Satoshi Sudou | 2006-07-04 |
| 7034723 | Timing comparator, data sampling apparatus, and testing apparatus | Masakatsu Suda, Satoshi Sudou | 2006-04-25 |