Issued Patents All Time
Showing 101–118 of 118 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6303926 | Optical sampler | — | 2001-10-16 |
| 6297672 | CMOS integrated circuit | — | 2001-10-02 |
| 6285692 | Method and apparatus for driving laser diode | — | 2001-09-04 |
| 6268757 | Semiconductor device having capacitor that reduce fluctuation of power supply | — | 2001-07-31 |
| 6257771 | Opitcal/electrical hybrid wiring board and its manufacturing method | — | 2001-07-10 |
| 6201822 | Optical signal transmission apparatus and optical signal transmission method | — | 2001-03-13 |
| 6166575 | Signal transmission circuit achieving significantly improved response time of a driven circuit, CMOS semiconductor device and circuit board therefor | — | 2000-12-26 |
| 6157200 | Integrated circuit device tester | — | 2000-12-05 |
| 6114898 | Method of signal transmission between semiconductor integrated circuits and output drive circuit for use therewith | — | 2000-09-05 |
| 6094085 | Driver circuit with temperature correction circuit | Satoshi Iwamoto | 2000-07-25 |
| 6025747 | Logic signal selection circuit | Hiroo Suzuki | 2000-02-15 |
| 5973542 | Driver circuit with temperature correction circuit | Satoshi Iwamoto | 1999-10-26 |
| 5942902 | Method of measuring delay time and random pulse train generating circuit used in such method | — | 1999-08-24 |
| 5898326 | Signal transmission cable driver apparatus without a peaking coil | — | 1999-04-27 |
| 5764598 | Delay time measurement apparatus for delay circuit | — | 1998-06-09 |
| 5731735 | Power supply circuit for driving an integrated circuit, wherein the power supply is adjusted based on temperature so that a delay variation within the IC according to temperature may be cancelled | Shinichi Yokota | 1998-03-24 |
| 5712582 | Test signal generator having timing calibration circuit | Shinichi Yokota | 1998-01-27 |
| 5491673 | Timing signal generation circuit | — | 1996-02-13 |