SI

Satoshi Iwamoto

AD Advantest: 13 patents #57 of 1,193Top 5%
TK Toshiba Tec Kabushiki Kaisha: 5 patents #551 of 1,664Top 35%
KT Kabushiki Kaisha Toshiba: 4 patents #6,684 of 21,451Top 35%
SK Showa Denko K.K.: 4 patents #353 of 1,736Top 25%
PA Panasonic: 2 patents #9,678 of 21,108Top 50%
NE Nec: 1 patents #7,889 of 14,502Top 55%
SD Showa Denko: 1 patents #231 of 593Top 40%
JS Jsr: 1 patents #649 of 1,137Top 60%
TT The University Of Tokyo: 1 patents #1,000 of 2,633Top 40%
JR Japan Synthetic Rubber: 1 patents #256 of 558Top 50%
Fujitsu Limited: 1 patents #14,843 of 24,456Top 65%
Overall (All Time): #128,751 of 4,157,543Top 4%
29
Patents All Time

Issued Patents All Time

Showing 25 most recent of 29 patents

Patent #TitleCo-InventorsDate
12415372 Printer having sensor to detect remaining wound amount of label paper 2025-09-16
12099263 Magneto-optical material and production method therefor Yasutomo Ota, Kenji Ikeda, Nobukiyo Kobayashi 2024-09-24
10289043 Fixing device and image forming apparatus 2019-05-14
10101693 Fixing device and image forming apparatus 2018-10-16
9871347 Semiconductor light emitting device and optical transceiver Nobuaki Hatori, Masashige Ishizaka, Takanori Shimizu, Yasuhiko Arakawa, Katsuaki Tanabe 2018-01-16
9727009 Fixing device and image forming apparatus 2017-08-08
8427188 Test apparatus 2013-04-23
8405415 Test apparatus synchronous module and synchronous method Koichi Yatsuka 2013-03-26
8362791 Test apparatus additional module and test method Motoo Ueda, Masaru Goishi, Hiroyasu Nakayama, Masaru Tsuto 2013-01-29
8261119 Test apparatus for testing device has synchronization module which synchronizes analog test module to digital test module based on synchronization signal received from digital test module 2012-09-04
8155541 Fixing device which detects anomaly of heater 2012-04-10
7906981 Test apparatus and test method Koichi Yatsuka 2011-03-15
7876118 Test equipment Shigeki Takizawa, Koichi Yatsuka, Toshio Matsuura 2011-01-25
7802140 Diagnostic program, a switching program, a testing apparatus, and a diagnostic method 2010-09-21
7781291 Semiconductor device and method for fabricating the same Nobuyoshi Takahashi, Fumihiko Noro, Masatoshi Arai 2010-08-24
7610538 Test apparatus and performance board for diagnosis 2009-10-27
7598589 Semiconductor device Nobuyoshi Takahashi, Fumihiko Noro, Masatoshi Arai 2009-10-06
7552028 Recording medium, test apparatus and diagnostic method 2009-06-23
7398169 Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device Takahiro Yamaguchi, Masakatsu Suda, Masahiro Ishida 2008-07-08
7158908 Test apparatus, diagnosing program and diagnosing method therefor 2007-01-02
7141355 Radiation-sensitive resin composition Shin-ichiro Iwanaga, Tooru Kimura, Hiroko Nishimura, Koji Nishikawa 2006-11-28
6323298 Propylene-based polymer, method for its production, composition thereof, catalyst component for polymerization, and method for its production Hisayoshi Yanagihara, Kazuyuki Watanabe, Hirotoshi Takahashi, Kazuharu Itoh 2001-11-27
6184328 Propylene-based polymer, method for its production, composition thereof, catalyst component for polymerization, and method for its production Hisayoshi Yanagihara, Kazuyuki Watanabe, Hirotoshi Takahashi, Kazuharu Itoh 2001-02-06
6094085 Driver circuit with temperature correction circuit Toshiyuki Okayasu 2000-07-25
5973542 Driver circuit with temperature correction circuit Toshiyuki Okayasu 1999-10-26