Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8743702 | Test apparatus and test method | Shinichi Ishikawa, Masaru Goishi, Masaru Tsuto | 2014-06-03 |
| 8692566 | Test apparatus and test method | Shinichi Ishikawa, Masaru Goishi, Masaru Tsuto | 2014-04-08 |
| 8686525 | Magnetic sensor and magnetic memory | Eiji Saitoh, Kazuya Harii | 2014-04-01 |
| 8666691 | Test apparatus and test method | Shinichi Ishikawa, Tetsu Katagiri, Masaru Goishi, Masaru Tsuto | 2014-03-04 |
| 8604571 | Thermoelectric conversion device | Kenichi Uchida, Yosuke Kajiwara, Eiji Saitoh | 2013-12-10 |
| 8483073 | Test apparatus and test method | Shinichi Ishikawa, Masaru Goishi, Masaru Tsuto | 2013-07-09 |
| 8362791 | Test apparatus additional module and test method | Motoo Ueda, Satoshi Iwamoto, Masaru Goishi, Masaru Tsuto | 2013-01-29 |
| 8165027 | Test apparatus and test method | Shinichi Ishikawa, Masaru Goishi, Masaru Tsuto | 2012-04-24 |
| 8149721 | Test apparatus and test method | Shinichi Ishikawa, Hajime Sugimura, Masaru Goishi, Masaru Tsuto | 2012-04-03 |
| 8059547 | Test apparatus and test method | Masaru Goishi, Masaru Tsuto | 2011-11-15 |
| 7472327 | Pattern generator and test apparatus | — | 2008-12-30 |
| 7235995 | Test apparatus and testing method | Tomoyuki Sugaya | 2007-06-26 |
| 7015685 | Semiconductor tester | — | 2006-03-21 |
| 6604058 | Semiconductor device testing apparatus and method for testing semiconductor device | — | 2003-08-05 |
| 6587983 | Apparatus and method of testing a semiconductor device | — | 2003-07-01 |
| 6058486 | Timing generator for plural reference clock frequencies | Masayuki Itoh | 2000-05-02 |
| 5903745 | Timing generator for plural reference clocks | Masayuki Itoh | 1999-05-11 |