| 9262376 |
Test apparatus and test method |
— |
2016-02-16 |
| 8743702 |
Test apparatus and test method |
Shinichi Ishikawa, Masaru Goishi, Hiroyasu Nakayama |
2014-06-03 |
| 8692566 |
Test apparatus and test method |
Shinichi Ishikawa, Masaru Goishi, Hiroyasu Nakayama |
2014-04-08 |
| 8666691 |
Test apparatus and test method |
Shinichi Ishikawa, Tetsu Katagiri, Masaru Goishi, Hiroyasu Nakayama |
2014-03-04 |
| 8483073 |
Test apparatus and test method |
Shinichi Ishikawa, Masaru Goishi, Hiroyasu Nakayama |
2013-07-09 |
| 8362791 |
Test apparatus additional module and test method |
Motoo Ueda, Satoshi Iwamoto, Masaru Goishi, Hiroyasu Nakayama |
2013-01-29 |
| 8165027 |
Test apparatus and test method |
Shinichi Ishikawa, Masaru Goishi, Hiroyasu Nakayama |
2012-04-24 |
| 8149721 |
Test apparatus and test method |
Shinichi Ishikawa, Hajime Sugimura, Masaru Goishi, Hiroyasu Nakayama |
2012-04-03 |
| 8059547 |
Test apparatus and test method |
Masaru Goishi, Hiroyasu Nakayama |
2011-11-15 |
| 6769083 |
Test pattern generator, a testing device, and a method of generating a plurality of test patterns |
Tatsuya Yamada |
2004-07-27 |
| 6678852 |
Semiconductor device testing apparatus |
— |
2004-01-13 |
| 6601204 |
Pattern generating method, pattern generator using the method, and memory tester using the pattern generator |
— |
2003-07-29 |
| 6499126 |
Pattern generator and electric part testing apparatus |
— |
2002-12-24 |
| 6484282 |
Test pattern generator, a memory testing device, and a method of generating a plurality of test patterns |
— |
2002-11-19 |
| 6363022 |
Semiconductor memory device tester |
— |
2002-03-26 |
| 6138259 |
Semiconductor memory testing apparatus |
— |
2000-10-24 |
| 6032275 |
Test pattern generator |
— |
2000-02-29 |
| 5850402 |
Test pattern generator |
— |
1998-12-15 |